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Investigation of deep level impurities (oxygen and chromium) in bulk gallium arsenide and Au-GaAs Schottky diodes (1973)


Author: Huang, Chern I., 1940-
Subject: Diodes, Semiconductor; Gallium arsenide; Semiconductors; Transistors
Language: English
Call number: 585123
Digitizing sponsor: University of Florida, George A. Smathers Libraries
Book contributor: University of Florida, George A. Smathers Libraries
Collection: UFRDS; univ_florida_smathers; americana

Full catalog record: MARCXML

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Thesis -- University of Florida

Vita

Bibliography: leaves 71-72


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Page-progression: lr
Scanningcenter: rich
Mediatype: texts
Identifier: investigationofd00huan
Ppi: 300
Camera: Canon 5D
Operator: scanner-emonie-hubbart@...
Scanner: scribe7.rich.archive.org
Scandate: 20091016030139
Imagecount: 92
Identifier-access: http://www.archive.org/details/investigationofd00huan
Identifier-ark: ark:/13960/t2794qb28
Ocr: ABBYY FineReader 8.0
Sponsordate: 20091031

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